JIS C 2170:2004
Electrostatics -- Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation

Standard No.

JIS C 2170:2004

Release Date

2004

Published By

Japanese Industrial Standards Committee (JISC)

Status

Be replaced

Replace By

JIS C 2170 ERRATUM 1:2010

Latest

JIS C 2170 ERRATUM 1:2010

Scope

This standard specifies methods for testing the electrical resistance and resistivity of solid planar materials in the range 104-10I2Ω to prevent electrostatic charge build-up. It takes into account existing ISO/IEC standards and other published information and provides recommendations and guidance on appropriate methods. Note: The corresponding international standards for this standard are shown below. The symbols representing the degree of correspondence are IDT (matched), MOD (modified), and NEQ (not equivalent) based on ISO/IEC Guide 21.

JIS C 2170:2004 history

• 2010 JIS C 2170 ERRATUM 1:2010 ERRATUM
• 2004 JIS C 2170:2004 Electrostatics -- Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation