IEC 62431:2008
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods

Standard No.
IEC 62431:2008
Release Date
2008
Published By
International Electrotechnical Commission (IEC)
Latest
IEC 62431:2008
Replace
IEC 46F/65/CDV:2007 IEC/PAS 62431:2005
Scope
This International Standard specifies the measurement methods for the reflectivity of electromagnetic wave absorbers (EMA) for the normal incident, oblique incident and each polarized wave in the millimetre-wave range. In addition, these methods are also equally effective for the reflectivity measurement of other materials: - measurement frequency range: 30 GHz to 300 GHz; - reflectivity: 0 dB to-50 dB; - incident angle: 0~ to 80~. NOTE This standard is applicable not only to those EMA which are widely used as counter-measures against communication faults, radio interference etc., but also to those used in an anechoic chamber in some cases. EMAs may be any kind of material, and may have any arbitrary shape, configuration, or layered structure as pointed out below. Material: Conductive material, dielectric material, magnetic material. Shape: planar-, pyramidal-, wedge-type, or other specific shapes. Layer structure: single layer, multi layers, or graded-index material.

IEC 62431:2008 Referenced Document

  • ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories [Standard in French]*2017-11-01 Update

IEC 62431:2008 history

  • 2008 IEC 62431:2008 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods



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