ASTM E1829-97
Standard Guide for Handling Specimens Prior to Surface Analysis

Standard No.

ASTM E1829-97

Release Date

1997

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM E1829-02

Latest

ASTM E1829-14(2020)

Scope

1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3 Secondary ion mass spectrometry, SIMS.

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM E1829-97 history

• 2020 ASTM E1829-14(2020) Standard Guide for Handling Specimens Prior to Surface Analysis
• 2014 ASTM E1829-14 Standard Guide for Handling Specimens Prior to Surface Analysis
• 2009 ASTM E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis
• 2002 ASTM E1829-02 Standard Guide for Handling Specimens Prior to Surface Analysis
• 1997 ASTM E1829-97 Standard Guide for Handling Specimens Prior to Surface Analysis