ASTM E1438-91(1996)
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

Standard No.

ASTM E1438-91(1996)

Release Date

1991

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM E1438-91(2001)

Latest

ASTM E1438-11(2019)

Scope

1.1 This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens. This guide does not apply to data obtained from analyses of specimens with thin markers or specimens without interfaces such as ion-implanted specimens.

1.2 This guide does not describe methods for the optimization of interface width or the optimization of depth resolution.

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM E1438-91(1996) history

• 2019 ASTM E1438-11(2019) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
• 2011 ASTM E1438-11 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
• 2006 ASTM E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
• 1991 ASTM E1438-91(2001) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
• 1991 ASTM E1438-91(1996) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS