IEC 60749-13:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Standard No.

IEC 60749-13:2002/COR1:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2018-02

Replace By

IEC 60749-13:2018

Latest

IEC 60749-13:2018

Scope

This is Technical Corrigendum 1 to IEC 60749-13-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 13:Salt atmosphere)

IEC 60749-13:2002/COR1:2003 history

• 2018 IEC 60749-13:2018 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
• 2003 IEC 60749-13:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
• 2002 IEC 60749-13:2002 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere