IEC 60749-27:2003
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM)

Standard No.

IEC 60749-27:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2006-07

Replace By

IEC 60749-27:2006

Latest

IEC 60749-27:2006/AMD1:2012

Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable

IEC 60749-27:2003 history

• 2012 IEC 60749-27:2006/AMD1:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• 2012 IEC 60749-27:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• 2006 IEC 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• 2003 IEC 60749-27:2003 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM)