JJG 21-2008
Verification Regulation of Micrometer (English Version)
- Standard No.
- JJG 21-2008
- Language
- Chinese, Available in English version
- Release Date
- 2008
- Published By
- National Metrological Verification Regulations of the People's Republic of China
- Latest
- JJG 21-2008
- Replace
- JJG 21-1995
- Scope
- This procedure is applicable to external diameter micrometers with a graduation value of 0.Olmm and a measuring upper limit of 500mm; plate thickness and wall thickness micrometers with a measuring upper limit of 25mm; and digital micrometers with a resolution of 0.OOlmm, 0.0001mm and a measuring upper limit of 500mm. Initial calibration, subsequent calibration and in-service inspection of micrometers showing outer diameter.
JJG 21-2008 Referenced Document
- GB/T 1216-2004 External micrometer
- GB/T 20919-2007 External micrometer with electronic digital display
- JB/T 2989-1999 Sheet metal micrometer
- JJF 1001-1998 General Terms in Metrology and Their Definitions
- JJF 1059-1999 Evaluation and Expression of Uncertainty in Measurement
- JJF 1094-2002 T.S. for Evaluation of the Characteristics of Measuring Instruments*， 2024-04-19 Update
JJG 21-2008 history
- 2008 JJG 21-2008 Verification Regulation of Micrometer
- 1995 JJG 21-1995 Verification Regulation of Micrometer
