UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
Due to the limited penetration power of the electron beam, the specimens of materials intended for observation under the electron microscope must be extremely thin and in most cases their thickness must not be greater than 100 nm. Electron microscopic examination of the surfaces of metallic materials can be done through the use of a scanning electron microscope (direct observation) or through the use of a transmission electron microscope (indirect observation). In the latter case, preparation of the reply is necessary. The test tube is generally not destroyed. The replication preparation techniques are numerous and can be divided as follows: one-stage replications (direct or negative); two-stage replications (indirect or positive). Polishing and etching of the surfaces to be examined. Preparation of one-stage replicas. Preparation of two-stage replicas in cellulose acetate-carbon.
UNI 7329-1974 history
1974UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.