JIS C 3660-1-4:2003
Common test methods for insulating and sheathing materials of electric and optical cables -- Part 1-4: Methods for general application -- Test at low temperature

Standard No.

JIS C 3660-1-4:2003

Release Date

2003

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS C 3660-1-4:2003

Replace

JIS C 3660-1-4:1998

Scope

This standard specifies testing methods for insulating and sheathing materials, such as electrical and optical cables for power distribution, telecommunications and marine equipment. This standard specifies low-temperature testing of vinyl and polyethylene compounds for general insulation and sheath applications. Note: The corresponding international standards for this standard are shown below. The symbols representing the degree of correspondence are IDT (matched), MOD (modified), and NEQ (not equivalent) based on ISO/IEC Guide 21.

JIS C 3660-1-4:2003 history

• 2003 JIS C 3660-1-4:2003 Common test methods for insulating and sheathing materials of electric and optical cables -- Part 1-4: Methods for general application -- Test at low temperature
• 1998 JIS C 3660-1-4:1998 Common test methods for insulating and sheathing materials of electric cables -- Part 1: Methods for general application -- Section 4: Test at low temperature