This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron micro-scope (SEM). It is destructive and has an uncertainty of less than 10 % or 0,1 |jm, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope (ISO 1463) when applicable.
SIS SS-ISO 9220:1989 history
1989SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method