NF C96-022-16*NF EN 60749-16:2003
Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND).

Standard No.

NF C96-022-16*NF EN 60749-16:2003

Release Date

2003

Published By

Association Francaise de Normalisation

Latest

NF C96-022-16*NF EN 60749-16:2003

NF C96-022-16*NF EN 60749-16:2003 history

• 2003 NF C96-022-16*NF EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND).