DIN EN 60749-18:2003
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003
- Standard No.
- DIN EN 60749-18:2003
- Release Date
- 2003
- Published By
- German Institute for Standardization
- Status
- Replace By
- DIN EN 60749-18 E:2018
- Latest
- DIN EN 60749-18 E:2018-10
- Replace
- DIN EN 60749-18:2002
- Scope
- The test procedure described in this standard defines the reqirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionisind radiation (total dose) effects from a cobalt-60 gamma ray source. In addition this procedure provides an accelerated annealing test for estimating low dose rate ionising radiation effects on devices
DIN EN 60749-18:2003 history
- 1970 DIN EN 60749-18 E:2018-10 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
- 2018 DIN EN 60749-18 E:2018 Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
- 2003 DIN EN 60749-18:2003 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003
- 0000 DIN EN 60749-18:2002
