BS EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods - Die shear strength
- Standard No.
- BS EN 60749-19:2003
- Release Date
- 2003
- Published By
- British Standards Institution (BSI)
- Status
- 2003-06
- Replace By
- BS EN 60749-19:2003+A1:2010
- Latest
- BS EN 60749-19:2003+A1:2010
- Scope
- This part of IEC 60749 determines (see note) the integrity of materials and procedures used to attach semiconductor die to package headers or other substrates (for the purpose of this test method, the term "semiconductor die" should be taken to include passive elements).
This test method is generally only applicable to cavity packages or as a process monitor. It is not applicable for die areas greater than 10 mm
. It is also not applicable to flip chip technology or to flexible substrates. NOTE This determination is based on a measure of the force applied to the die or to the element, and, if a failure occurs, the type of failure resulting from the application of force and the visual appearance of the residual die attach medium and the header/substrate metallization.
BS EN 60749-19:2003 history
- 2003 BS EN 60749-19:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods. Die shear strength
- 2003 BS EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods - Die shear strength
