GB/T 11685-2003
Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers (English Version)

Standard No.

GB/T 11685-2003

Language

Chinese, Available in English version

Release Date

2003

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 11685-2003

Replace

GB/T 8992-1988 GB/T 11685-1989

Scope

This standard specifies the measurement methods for the main characteristics of semiconductor X-ray detector systems and semiconductor X-ray energy spectrometers. This standard applies to the measurement of the main performance of semiconductor X-ray detector systems and semiconductor X-ray energy spectrometers.

GB/T 11685-2003 history

• 2003 GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• 0000 GB/T 11685-1989
• 0000 GB/T 8992-1988