KS M 0044-1999
General rules for scanning electron microscopy

Standard No.

KS M 0044-1999

Release Date

1999

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Latest

KS M 0044-1999

Scope

This Korean Industrial Standard specifies general matters which are needed when the morphological observation and analysis of micro spot on specimen surface are carried out mainly owing to the secondary electrons using a scanning electron microscope.

KS M 0044-1999 history

• 1999 KS M 0044-1999 General rules for scanning electron microscopy