KS C 6046-1986
ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES

Standard No.

KS C 6046-1986

Release Date

1986

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS C 6046-1978(2001)

Latest

KS C 6046-1978(2001)

KS C 6046-1986 history

• 0000 KS C 6046-1978(2001)
• 1986 KS C 6046-1986 ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES