IS 12737-1988
Standard test procedures for semiconductor X-ray energy spectrometers

Standard No.

IS 12737-1988

Release Date

1990

Published By

IN-BIS

Latest

IS 12737-1988

Scope

This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this standard. Clause 5 is essentially tutorial.

IS 12737-1988 history

• 1990 IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers