IS 4400 Pt.1-1967
Semiconductor device measurement methods Part Ⅰ General principles

Standard No.

IS 4400 Pt.1-1967

Release Date

1968

Published By

IN-BIS

Latest

IS 4400 Pt.1-1967

Scope

This standard ( Part I) covers the general conditions relating to measurements on all types of semiconductor devices.

IS 4400 Pt.1-1967 history

• 1968 IS 4400 Pt.1-1967 Semiconductor device measurement methods Part Ⅰ General principles