IS 12641-1989
Environmental testing procedures for semiconductor devices and integrated circuits

Standard No.

IS 12641-1989

Release Date

1990

Published By

IN-BIS

Latest

IS 12641-1989

Scope

This standard lays down the environmental testing methods to assess the quality under various conditions of production, use, transport and storage, etc, of semiconductor devices and integrated circuits.

IS 12641-1989 history

• 1990 IS 12641-1989 Environmental testing procedures for semiconductor devices and integrated circuits