Defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.
IEC 61747-1:2003 history
2003IEC 61747-1:1998/AMD1:2003 Liquid crystal and solid-state display devices - Part 1: Generic specification; Amendment 1
2003IEC 61747-1:2003 Liquid crystal and solid-state display devices - Part 1: Generic specification
1998IEC 61747-1:1998 Liquid crystal and solid-state display devices - Part 1: Generic specification