DIN 50451-1:2003
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
- Standard No.
- DIN 50451-1:2003
- Release Date
- 2003
- Published By
- German Institute for Standardization
- Status
- Replace By
- DIN 50451-1:2003-04
- Latest
- DIN 50451-1:2003-04
- Replace
- DIN 50451-1:1987 DIN 50451-1:2002
- Scope
- The document specifies a method for testing nitric acid for the relevant metal traces of silver, gold, copper, iron, potassium and sodium in trace quantities, for which the method of atomic absorption spectroscopy (AAS) with electrothermic atomizing is used. The range of application covers trace element mass fractions from 0,1 ng/g to 50 ng/g.
DIN 50451-1:2003 history
- 2003 DIN 50451-1:2003-04 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
- 2003 DIN 50451-1:2003 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
- 0000 DIN 50451-1:2002
- 0000 DIN 50451-1:1987
