IEC 60749-18:2002
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
- Standard No.
- IEC 60749-18:2002
- Release Date
- 2002
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 60749-18:2019 RLV
- Latest
- IEC 60749-18:2019 RLV
- Replace
- IEC 47/1657/FDIS:2002
- Scope
- This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (
Co) gamma ray source. This standard provides an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. This standard addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and space-related applications. This standard may produce severe degradation of the electrical properties of irradiated devices and thus should be considered a destructive test.
IEC 60749-18:2002 history
- 0000 IEC 60749-18:2019 RLV
- 2002 IEC 60749-18:2002 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
