CNS 12865-10-1992
Method of Test for Digital Microelectronics `6rFunctional Testing`6s (English Version)

Standard No.

CNS 12865-10-1992

Language

Chinese, Available in English version

Release Date

1992

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 12865-10-1992

Scope

This standard specifies methods for assuring circuit performance in relation to the test requirements necessary to verify specified functionality and to ensure that all logic component paths are not disconnected, do not remain at a high level, or do not remain at a low level. This inspection method is suitable for digital microelectronic components, such as TTL, DTL, RTL, ECL and MOS.

CNS 12865-10-1992 history

• 1992 CNS 12865-10-1992 Method of Test for Digital Microelectronics `6rFunctional Testing`6s