CNS 12865-3-1991
Method of Test for Digital Microelectronics ( Low Level Input Current ) (English Version)

Standard No.

CNS 12865-3-1991

Language

Chinese, Available in English version

Release Date

1991

Published By

Taiwan Provincial Standard of the People's Republic of China

Latest

CNS 12865-3-1991

Scope

This standard specifies the low-level input load of digital microelectronic components, which may be a minimum value (IIL min) or a maximum value (IIL max) to ensure that the circuit performance is within the limits specified by the relevant procurement culture. Such as TTL, DTL, RTL, ECL and MOS.

CNS 12865-3-1991 history

• 1991 CNS 12865-3-1991 Method of Test for Digital Microelectronics ( Low Level Input Current )