CNS 12865-8-1991
Method of Test for Digital Microelectronics ( Load Condition ) (English Version)

Standard No.
CNS 12865-8-1991
Language
Chinese, Available in English version
Release Date
1991
Published By
Taiwan Provincial Standard of the People's Republic of China
Latest
CNS 12865-8-1991
Scope
This standard specifies additional load conditions required for static or dynamic measurements of digital microelectronic components, such as TTL, DTL, RTL, ECL and MOS.

CNS 12865-8-1991 history

  • 1991 CNS 12865-8-1991 Method of Test for Digital Microelectronics ( Load Condition )
Method of Test for Digital Microelectronics ( Load Condition )



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