YS/T 666-2008
Chemical analysis methods of gallium for industrial use.Determination of impurity elements.Inductively coupled plasma atomic emission spectrometric method (English Version)

Standard No.

YS/T 666-2008

Language

Chinese, Available in English version

Release Date

2008

Published By

Professional Standard - Non-ferrous Metal

Latest

YS/T 666-2008

Scope

This standard specifies methods for the determination of silicon, sodium, potassium, magnesium, calcium and aluminum content in industrial gallium. This standard is applicable to the determination of silicon, sodium, potassium, magnesium, calcium and aluminum content in industrial gallium [99.9%≤ω(%)≤99.995%]. The measurement range is shown in Table 1.

YS/T 666-2008 history

• 2008 YS/T 666-2008 Chemical analysis methods of gallium for industrial use.Determination of impurity elements.Inductively coupled plasma atomic emission spectrometric method