This PAS describes the measurement method of dielectric properties in the planer direction of
dielectric plate at microwave frequency in order to develop new materials and to design
microwave active and passive devices. This method is called a cavity resonator method.
This method has the following characteristics:
? the relative permittivity ε′ and loss tangent tan δ values of a dielectric plate sample can be
measured accurately and non-destructively;
? temperature dependence of complex permittivity can be measured;
? the measurement accuracy is within 0,3% for ε′ and within 5 ×10-6 for tan δ;
? fringing effect is corrected using correction charts calculated on the basis of rigorous
analysis.
This method is applicable for measurements in the following conditions:
? frequency : 2 GHz < f < 40 GHz;
? relative permittivity : 2 < ε′ < 100;
? loss tangent : 10–6 < tan δ < 10–2.
IEC PAS 62562:2008 history
2008IEC PAS 62562:2008 Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
IEC PAS 62562:2008 Cavity resonator method to measure the complex permittivity of low-loss dielectric plates was changed to IEC 62562:2010 Cavity resonator method to measure the complex permittivity of low-loss dielectric plates.