IEC 60748-23-2:2002
Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures; Manufacturing line certification; Internal visual inspection and special tests

Standard No.

IEC 60748-23-2:2002

Release Date

2002

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60748-23-2:2002

Replace

IEC 47A/639/FDIS:2002

Scope

Applies to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module micro

IEC 60748-23-2:2002 history

• 2002 IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures; Manufacturing line certification; Internal visual inspection and special tests