JEDEC JEB5-A-1970
Methods of Measurement for Semiconductor Logic Gating Microcircuits
- Standard No.
- JEDEC JEB5-A-1970
- Release Date
- 1970
- Published By
- (U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- Latest
- JEDEC JEB5-A-1970
- Scope
- For the c i r c u i t configurations of semiconductor logic gating microc i r c u i t s which use binary states to represent the d i g i t a l information, a l o g i c a l relationship exists between input and output. The l o g i c a l conditions can be i d e n t i f i e d by the electrical parameters measured on the input and output to describe the binary states. t o describe the states, but voltage is used most commonly. Voltages or currents may be used
JEDEC JEB5-A-1970 history
- 1970 JEDEC JEB5-A-1970 Methods of Measurement for Semiconductor Logic Gating Microcircuits
