IEC 61193-2:2007
Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages

Standard No.
IEC 61193-2:2007
Release Date
2007
Published By
International Electrotechnical Commission (IEC)
Latest
IEC 61193-2:2007
Replace
IEC 91/690/FDIS:2007
Scope
This part of IEC 61193 applies to the inspection of electronic components, packages, and also modules (referred to as “products” in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures. The zero acceptance number sampling plans provided by this standard apply to the inspection of products, that are manufactured under suitable process control with the target of a “zerodefect” quality level before sampling inspection. In addition, this standard provides a method for the calculation of the expected value of the statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things, this method can be used to verify the effectiveness of the supplier’s process control. NOTE In this standard the term “module” is used for products which are modules according to the definition in IEC 60194.

IEC 61193-2:2007 Referenced Document

  • IEC 60194 Printed board design, manufacture and assembly - Terms and definitions*2015-04-01 Update
  • ISO 2859-1:1999 Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
  • ISO 3534-2:2006 Statistics - Vocabulary and symbols - Part 2: Applied statistics

IEC 61193-2:2007 history

  • 2007 IEC 61193-2:2007 Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages



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