JB/T 5537-2006
Semiconductor pressure sensors (English Version)
- Standard No.
- JB/T 5537-2006
- Language
- Chinese, Available in English version
- Release Date
- 2006
- Published By
- Professional Standard - Machinery
- Latest
- JB/T 5537-2006
- Replace
- JB/T 5537-1991
- Scope
- This standard specifies the basic parameters and performance indicators, requirements, test methods, marking, packaging, transportation and storage of semiconductor pressure sensors. This standard applies to compensated pressure sensors using semiconductor materials as pressure-sensing components. It also applies to pressure sensors made of non-semiconductor materials (such as insulating and ferroelectric materials).
JB/T 5537-2006 Referenced Document
- GB/T 15464-1995 Gmeneral-purpose specification for the packaging instrumentation products
- GB/T 15478-1995 Test methods of the performances for pressure transducer/sensor
- GB/T 2423.1-2001 Environmental testing for electric and electronic products Part 2: Test methods Tests A: Cold
- GB/T 2423.10-1995 Environmental testing for electric and electronic products. Part 2: Test methods. Test Fc and guidance: Vibration (Sinusoidal)
- GB/T 2423.15-1995 Environmental testing for electric and electronic products. Part 2: Test methods. Test Ga and guidance: Acceleration, steady state
- GB/T 2423.16-1999 Environmental testing for electric and electronic products-- Part 2: Tests--Test J and guidance: Mould growth
- GB/T 2423.17-1993 Basic environmental testing procedures for electric and electronic products. Test Ka:Salt mist
- GB/T 2423.2-2001 Environmental testing for electric and electronic products Part 2: Test methods Tests B: Dry heat
- GB/T 2423.22-2002 Environmental testing for electric and electronic products--Part 2: Test methods Test N: Change of temperature
- GB/T 2423.3-1993 Basic environmental testing procedures for electric and electronic products. Test Ca:Damp heat,steady state
- GB/T 2423.5-1995 Environmental testing for electric and electronic products. Part 2: Test methods. Test Ea and guidance: Shock
- GB/T 2829-2002 Sampling procedures and tables for periodic inspection by attributes (Apply to inspection of process stability)
- JB/T 9329-1999 Basic environmental conditions and testing methods for instruments transportation and storage in the transportation
JB/T 5537-2006 history
- 2006 JB/T 5537-2006 Semiconductor pressure sensors
- 1991 JB/T 5537-1991 Semiconductor pressure sensor technical conditions
