SJ 2658.13-1986
Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient (English Version)

Standard No.

SJ 2658.13-1986

Language

Chinese, Available in English version

Published By

Professional Standard - Electron

Status

Be replaced 2016-04

Replace By

SJ/T 2658.13-2015

Latest

SJ/T 2658.13-2015

Scope

This standard is suitable for testing the temperature coefficient of output optical power of semiconductor infrared light-emitting diodes.

SJ 2658.13-1986 history

• 2015 SJ/T 2658.13-2015 Measuring method for semiconductor infrared-emitting diode.Part 13: Temperature coefficient for radiant power
• 1970 SJ 2658.13-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient

SJ 2658.13-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient was changed to SJ/T 2658.13-2015 Measuring method for semiconductor infrared-emitting diode.Part 13: Temperature coefficient for radiant power.