BS EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components

Standard No.

BS EN 60749-35:2006

Release Date

2006

Published By

British Standards Institution (BSI)

Latest

BS EN 60749-35:2006

Replace

04/30117780 DC-2004

Scope

This part of IEC 60749 defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. This standard provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

BS EN 60749-35:2006 history

• 2006 BS EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components