GB/T 17574.11-2006
Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory (English Version)
- Standard No.
- GB/T 17574.11-2006
- Language
- Chinese, Available in English version
- Release Date
- 2006
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 17574.11-2006
- Scope
- This Part of Semiconductor Device Integrated Circuit Part 2-11: Digital Integrated Circuit Single Supply Integrated Circuit EEPROM Blank Detail Specification, applicable to: marking and ordering information, application description, function description, limit value, operating conditions , electrical characteristics, programming, etc.
GB/T 17574.11-2006 history
- 2006 GB/T 17574.11-2006 Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
GB/T 17574.11-2006 -All Parts
GB/T 17574.10-2003 Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
GB/T 17574.11-2006 Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
GB/T 17574.20-2006 Semiconductor devices Integrated circuits Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuits
GB/T 17574.9-2006 Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories