SJ 20232-1993
Verification regulation of KDK double gate FET Gp tester (English Version)

Standard No.

SJ 20232-1993

Language

Chinese, Available in English version

Published By

Professional Standard - Electron

Status

Withdraw

Latest

SJ 20232-1993

Scope

This calibration procedure stipulates the calibration conditions, calibration items, calibration methods, calibration result processing and calibration cycle of Guoyang double-gate field effect transistor Gp parameter tester. This calibration procedure is applicable to the calibration of Guoyang double-gate field effect transistor Gp parameter tester.

SJ 20232-1993 history

• 1970 SJ 20232-1993 Verification regulation of KDK double gate FET Gp tester