QJ 1528-1988
Semiconductor integrated circuit time base test method (English Version)
- Standard No.
- QJ 1528-1988
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Aerospace
- Status
- Latest
- QJ 1528-1988
QJ 1528-1988 history
- 1970 QJ 1528-1988 Semiconductor integrated circuit time base test method
