QJ 1512-1988
Reliability Verification Test Method for Silicon Low Power NPN Transistor (English Version)
- Standard No.
- QJ 1512-1988
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Aerospace
- Status
- Latest
- QJ 1512-1988
QJ 1512-1988 history
- 1970 QJ 1512-1988 Reliability Verification Test Method for Silicon Low Power NPN Transistor
