This procedure is applicable to the initial calibration, subsequent calibration and in-use inspection of capacitive micrometers with a range of no more than 2000 μm and a resolution of 1 nm to 0.5 μm.
JJG 570-2006 Referenced Document
JJF 1001-1998 General Terms in Metrology and Their Definitions
JJF 1059-1999 Evaluation and Expression of Uncertainty in Measurement
JJF 1094-2002 T.S. for Evaluation of the Characteristics of Measuring Instruments*, 2024-04-18 Update