CISPR 16-4-4-2003
Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-4:Uncertainties,statistics and limit modelling - Statistics of complaints and a model for the calculation of limits

Standard No.
CISPR 16-4-4-2003
Release Date
2003
Published By
International Electrotechnical Commission (IEC)
Status
 2009-02
Replace By
CISPR/TR 16-4-1-2009
CISPR 16-4-4-2007
Latest
CISPR/TR 16-4-1-2009
CISPR 16-4-4-2007
Scope
This part of CISPR 16-4 describes the calculation of limits for disturbance field strength and disturbance voltage for the measurement on the test site on the basis of models for the generation of disturbance for radiation coupling respectively for mains coupling.

CISPR 16-4-4-2003 history

  • 2009 CISPR/TR 16-4-1-2009 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-1: Uncertainties, statistics and limit modelling – Uncertainties in standardized EMC tests
  • 2003 CISPR 16-4-4-2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-4:Uncertainties,statistics and limit modelling - Statistics of complaints and a model for the calculation of limits

CISPR 16-4-4-2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-4:Uncertainties,statistics and limit modelling - Statistics of complaints and a model for the calculation of limits was changed to CISPR/TR 16-4-1-2009 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-1: Uncertainties, statistics and limit modelling – Uncertainties in standardized EMC tests.

CISPR 16-4-4-2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-4:Uncertainties,statistics and limit modelling - Statistics of complaints and a model for the calculation of limits was changed to CISPR/TR 16-4-1-2009 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-1: Uncertainties, statistics and limit modelling – Uncertainties in standardized EMC tests.




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