IEC TS 62396-1:2006
Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

Standard No.
IEC TS 62396-1:2006
Release Date
2006
Published By
International Electrotechnical Commission (IEC)
Status
Latest
IEC TS 62396-1:2006
Replace By
IEC 62396-1:2012
Scope
This Technical Specification is intended to provide guidance on Atmospheric Radiation effects on Avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18,3 km). It defines the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems. This Technical Specification is intended to help aerospace equipment manufacturers and designers to standardise their approach to Single Event Effects in Avionics by providing guidance, leading to a standard methodology. Details of the radiation environment are provided together with identification of potential problems caused as a result of the atmospheric radiation received. Appropriate methods are given for quantifying Single Event Effect (SEE) rates in electronic components. The overall system safety methodology should be expanded to accommodate the Single Event Effects rates and to demonstrate the suitability of the electronics for the application at the component and system level.

IEC TS 62396-1:2006 history

  • 2006 IEC TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

IEC TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment was changed to IEC 62396-1:2012 Process management for avionics - Atmospheric radioation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment.




Copyright ©2024 All Rights Reserved