JIS C 5402-10-4:2006
Connectors for electronic equipment -- Tests and measurements -- Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests -- Test 10d: Electrical overload (connectors)

Standard No.

JIS C 5402-10-4:2006

Release Date

2006

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS C 5402-10-4:2006

Replace

JIS C 5402-10-4:2002

Scope

This standard specifies the test method for evaluating the ability of electronic equipment connectors (hereinafter referred to as connectors) when overload current flows through multiple connected contacts for a specified period of time from 100ms to 20s. do.

JIS C 5402-10-4:2006 Referenced Document

• JIS C 5402-1-1 Connectors for electronic equipment -- Tests and measurements -- Part 1-1: General examination -- Test 1a: Visual examination
• JIS C 5402-13-1 Connectors for electronic equipment -- Tests and measurements -- Part 13-1: Mechanical operation tests -- Test 13a: Engaging and separating forces*， 2015-11-20 Update
• JIS C 5402-2-1 Connectors for electronic equipment -- Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method

JIS C 5402-10-4:2006 history

• 2006 JIS C 5402-10-4:2006 Connectors for electronic equipment -- Tests and measurements -- Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests -- Test 10d: Electrical overload (connectors)
• 2002 JIS C 5402-10-4:2002 Connectors for electronic equipment -- Tests and measurements -- Part 10-4: Overload tests -- Test 10d: Electrical overload