BS IEC 60747-8:2001
Discrete semiconductor devices and integrated circuits - Field-effect transistors - Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors

Standard No.

BS IEC 60747-8:2001

Release Date

2001

Published By

British Standards Institution (BSI)

Status

Be replaced 2011-06

Replace By

BS IEC 60747-8:2010

Latest

BS IEC 60747-8:2010+A1:2021

Replace

92/34150 DC:1992 BS 6493-1.8:1985

Scope

To be read in conjunction with IEC 60747-1

BS IEC 60747-8:2001 history

• 2021 BS IEC 60747-8:2010+A1:2021 Semiconductor devices. Discrete devices - Field-effect transistors
• 2011 BS IEC 60747-8:2010 Semiconductor devices. Discrete devices. Field-effect transistors
• 2001 BS IEC 60747-8:2001 Discrete semiconductor devices and integrated circuits - Field-effect transistors - Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors