IEC PAS 62162:2000
Filed-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
- Standard No.
- IEC PAS 62162:2000
- Release Date
- 2000
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC PAS 62162:2000
IEC PAS 62162:2000 history
- 2000 IEC PAS 62162:2000 Filed-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
