ISO 3543:2000 PDF

Scope: WARNING Beta backscatter instruments used for the measurement of coating thicknesses use a number of different radioactive sources. Although the activities of these sources are normally very low, they can present a hazard to health, if incorrectly handled. Therefore, reference should be made to current international and national standards, where these exist. This International Standard specifies a method for the non-destructive measurement of coating thicknesses using beta backscatter gauges. It applies to both metallic and non-metallic coatings on both metallic and non-metallic substrates. To make use of this method, the atomic numbers or equivalent atomic numbers of the coating and the substrate need to differ by an appropriate amount. NOTE Since the introduction of the X-ray fluorescence method (ISO 3497), the beta backscatter method has been used less and less for the measurement of coating thickness. However, because of its lower cost, it is still a very useful method of measurement for many applications. In addition it has a wider measuring range.

ISO 3543:2000 history

2003 ISO 3543:2000/Cor 1:2003 Metallic and non-metallic coatings — Measurement of thickness — Beta backscatter method — Technical Corrigendum 1
2000 ISO 3543:2000 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
1981 ISO 3543:1981 Metallic and non-metallic coatings; Measurement of thickness; Beta backscatter method