IEC 60747-8:2000
Semiconductor devices - Part 8: Field-effect transistors

Standard No.

IEC 60747-8:2000

Release Date

2000

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2010-12

Replace By

IEC 60747-8:2010

Latest

IEC 60747-8:2010/AMD1:2021

Scope

This part of IEC 60747 gives standards for the following categories of field-effect transistors: - type A: junction-gate type; - type B: insulated-gate depletion type; - type C: insulated-gate enhancement type.

IEC 60747-8:2000 history

• 2021 IEC 60747-8:2010/AMD1:2021 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
• 2021 IEC 60747-8:2021 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
• 2010 IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
• 2000 IEC 60747-8:2000 Semiconductor devices - Part 8: Field-effect transistors
• 1970 IEC 60747-8:1984/AMD2:1993 Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
• 1970 IEC 60747-8:1984/AMD1:1991 Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
• 1984 IEC 60747-8:1984 Semiconductor devices. Discrete devices. Part 8 : Field-effect transistors