ISO 11254-1:2000 PDF

Scope: This part of ISO 11254 specifies a test method for determining the single-shot laser radiation-induced damage threshold (LIDT) of optical surfaces. This test procedure is applicable to all combinations of different laser wavelengths and pulse lengths. However comparison of laser damage threshold data may be misleading unless the measurements have been carried out at identical wavelengths, pulse lengths and beam diameters. Application of this part of ISO 11254 is provisionally restricted to irreversible damage of optical surfaces. NOTE Examples of units and scaling of laser-induced damage thresholds are given in annex C. WARNING — The extrapolation of damage data can lead to inaccurate or wrong calculated results and to an overestimation of the LIDT. In the case of toxic materials (e.g. ZnSe, GaAs, CdTe, ThF4, chalcogenides, Be, Cr, Ni) this could lead to severe health hazards.

ISO 11254-1:2000 Referenced Document

ISO 10110-7:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 7: Surface imperfection tolerances
ISO 11145:1994 Optics and optical instruments - Lasers and laser-related equipment - Vocabulary and symbols

2000 ISO 11254-1:2000 Lasers and laser-related equipment - Determination of laser-induced damage threshold of optical surfaces - Part 1: 1-on-1 test