NF M60-517-2:1998
Reference sources for the calibration of surface contamination monitors. Part 2 : electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

Standard No.

NF M60-517-2:1998

Release Date

1998

Published By

Association Francaise de Normalisation

Status

Be replaced 2010-10

Replace By

NF M60-517:2010

Latest

NF M60-517:2010

NF M60-517-2:1998 history

• 2010 NF M60-517:2010 Reference sources - Calibration of surface contamination monitors - Alpha-, beta- and photon emitters.
• 1998 NF M60-517-2:1998 Reference sources for the calibration of surface contamination monitors. Part 2 : electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.