GB/T 9424-1998 (English Version) PDF

Standard No.: GB/T 9424-1998
Language: Chinese, Available in English version
Release Date: 1998
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 9424-1998
Replace: GB/T 9424-1988

Scope: The IEC electronic component quality assessment system follows the IEC charter and works under the authorization of the IEC. The purpose of the system is to define a quality assessment procedure in such a way that electronic components released by a participating country in accordance with the relevant specifications are accepted equally by all other participating countries without further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and shall be used in conjunction with the following IEC standards. 747-10/QC700000 Semiconductor Devices Part 10 General Specifications for Discrete Devices and Integrated Circuits

GB/T 9424-1998 history

1998 GB/T 9424-1998 Semiconductor devices lntegrated circuits Part 2: Digital integrated circuits Section five--Blank detail specification for complementary MOS digital integrated circuits, series 4000B and 4000UB
0000 GB/T 9424-1988