JIS K 0132:1997
General rules for scanning electron microscopy

Standard No.

JIS K 0132:1997

Release Date

1997

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS K 0132:1997

Scope

This standard stipulates general matters when using a scanning electron microscope to observe and analyze the morphology of microscopic areas on the surface of a sample using mainly secondary electrons.

JIS K 0132:1997 history

• 1997 JIS K 0132:1997 General rules for scanning electron microscopy