The intent of the tests described is to establish standard test procedures for semiconductor detectors in use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measuremen
IEC 60333:1993 history
1993IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
1970IEC 60333:1983 Test procedures for semiconductor charged-particle detectors
1970IEC 60333:1970 Test procedures for semiconductor detectors for ionizing radiation