IEC 60333:1993
Nuclear instrumentation; semiconductor charged-particle detectors; test procedures

Standard No.
IEC 60333:1993
Release Date
1993
Published By
International Electrotechnical Commission (IEC)
Status
Latest
IEC 60333:1993
Scope
The intent of the tests described is to establish standard test procedures for semiconductor detectors in use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measuremen

IEC 60333:1993 history

  • 1993 IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
  • 1970 IEC 60333:1983 Test procedures for semiconductor charged-particle detectors
  • 1970 IEC 60333:1970 Test procedures for semiconductor detectors for ionizing radiation
Nuclear instrumentation; semiconductor charged-particle detectors; test procedures



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